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Applied Statistics & Systems Consultants, Ltd. (ASSC) develops a systematic approach for discovering the source of the fault that caused the degradation of yield in the manufacturing process of semiconductor IC (integrated circuits) devices.
ASSC develops and distributes YieldWise, software for near real-time analysis of yield in the manufacturing process of semiconductor IC devices. YieldWise is a software for analyzing of ET (electrical test) parameters. As such, it implements statistical technology of analysis and modeling, and provides data-management and graphical capabilities. YieldWise is available for Windows, Windows NT, Macintosh, OS/2, and Unix computers.
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