Applied Statistics & Systems Consultants, Ltd. (ASSC) has developed a systematic approach for discovering the source of faults that cause the degradation of yield in the manufacturing process of semiconductor IC (integrated circuits) devices. |
| ASSC offers YieldWise, a software solution for near real-time analysis of yield in the manufacturing process of semiconductor IC devices. YieldWise analyzes ET (electrical test) data and identifies hidden patterns and relationships among ET data, final test and manufacturing process data. As such, it combines statistical technology, analysis and modeling with data-management and graphical capabilities. |
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YieldWise is available for
Windows95®,
Windows NT®,
Macintosh®,
OS/2®,
and Unix® computers. |
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